WHITE PAPER
Critical SD-WAN Test Patterns and Measurements
![sc-sd-wan-critical-test-patterns-and-measurements](http://images.ctfassets.net/wcxs9ap8i19s/3aP2ogfLRRGVsIpt78F5OG/2cdfa4f6c4e32f10e7d6cb64a428ab56/sd-wan-critical-test-patterns-and-measurements.png?fm=jpg&h=349&w=620&q=75)
In today’s virtualized software-defined wide area network (SD-WAN) environments, an organization will move some or all of the traditional private WAN infrastructure over secure virtual ‘Circuits’ riding over public and semi-public clouds. This technology has great potential for WAN link spin up time and dramatic cost savings over traditional classic WAN links such as MPLS or dedicated point-to-point lines.
The technology is not without its deployment and operational challenges, however. It is especially critical how we test SD-WAN infrastructure and that we define a meaningful approach to its measurement.
This paper discusses the unique testing challenges and best practices associated with SD-WAN testing success.